Categories : Atom Probes
- Vendors - High Resolution / Electron Microscopy 157
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- Atom Probes 2
- Accessories for High Res. Electron Microscopy 4
- Anti Vibration Systems 2
- Anticontamination Systems 5
- Auger Microscopes 1
- Calibration Standards 8
- Cameras for Electron Microscopy 4
- Correlative Light and Electron Microscopes 2
- Cryo Correlative Light and Electron Microscopes 1
- Cryotransfer Systems 5
- Detectors (Electron and Ion) 3
- Detectors (Imaging) 1
- Dual and Triple Beam Scanning Electron Microscopes 6
- Electron Microscopes 3
- Electron and Ion Detectors 4
- Electron and Microscopy Nanolithography 1
- Energy Filtering Transmission Electron Microscopes 2
- Field Emission Microscopes 1
- Filaments and Apertures 9
- Force Measurement Systems 1
- Gas Injection Systems 5
- High Resolution / Electron Microscopy 1
- Image Analysis 10
- Light and Electron Microscopes 1
- Low Energy Electron Microscopes 1
- Magnetic Field Cancellation 4
- Micromanipulators 8
- Nano Probing Workstations 2
- Nanolithography Accessories 2
- Plasma Cleaners 5
- Scanning Electron Microscopes 9
- Scanning Transmission Electron Microscopes 1
- Secondary Ion Microscopes / SIMS 3
- Spectrometers (analytical) 1
- Spectrometers for EDX, WDX, EELS 3
- Storage 3
- Transmission Electron Microscopes 4
- Vacuum Equipement 4
- Water Coolers 2
- X-Ray Microscopes 4
- X-Ray Microtomography 6
- Vendors - Accessories for Electron Microscopy 127
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- Accessories for Electron Microscopy 7
- Anti Vibration Systems 3
- Anticontamination Systems 2
- Atom Probes 2
- Calibration Standards 9
- Cameras 4
- Cryotransfer Systems 7
- Detectors (Electron and Ion) 2
- Detectors (imaging) 3
- Electron and Ion Detectors 3
- Electron and Microscopy Nanolithography 3
- Filaments and Apertures 9
- Force Measurement Systems 3
- Gas Injection Systems 5
- Image Analysis 11
- Magnetic Field Cancellation 4
- Micromanipulators 8
- Nano Probing Workstations 2
- Nanolithography accessories 1
- Plasma Cleaners 8
- Spectrometers for EDX, WDX, EELS 3
- Storage 4
- Vacuum Equipment 11
- Water Coolers 2
- X-Ray Microtomography 5
- Vendors - Accessories for Light Microscopy 259
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- Accessories for Light Microscopy 21
- Autofocusing Devices 6
- Calibration Devices 7
- Calibration standards 4
- Cameras 16
- Condensers 3
- Environmental Chambers 12
- Expanded Pupil 1
- Eyepieces 8
- Filters and Beamsplitters 11
- Fluorescence Imaging and Spectroscopy 7
- General Optics 11
- Graticules 7
- High Resolution Imaging 3
- Illuminators 19
- Image Analysis 15
- LEDS 15
- Lamps 7
- Lasers 8
- Microinjectors 6
- Micromanipulators 10
- Objectives 11
- Optical Accessories 8
- Optical Tweezers 3
- Phase Contrast 3
- Raman Microspectroscopy 2
- Scanning Heads 7
- Stages 16
- Stands 8
- Viewing Heads 4
- Vendors - Accessories for Scanning Probe Microscopy 31
- Vendors - Compositional Analysis 32
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- Atom Probe Tomography 2
- Calibration Devices 2
- Calibration Standards 4
- Cathodoluminescence 2
- Compositional Analysis 1
- Dispersive X-ray Spectroscopy / EDX / WDS 6
- Electron Back Scattered Diffraction 3
- Electron Energy Loss Spectroscopy 1
- Electron Probe Micro Analysis 2
- Mass Spectrometry 3
- Raman Microscopes 1
- Rutherford Backscatter Spectroscopy 2
- Secondary Ion Microscopes / SIMS 2
- Vendors - Digital Imaging & Analysis 103
- Vendors - General Accessories 59
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- Anti-vibration & Isolation Devices 10
- Cryo Microscopy 3
- General Accessories 10
- Heating/cooling stages 1
- High Purity Materials 2
- Mica 2
- Microhardness and Failure Testing 1
- QCM 2
- Sample stages for X-ray µCT 1
- Small Tools 6
- Tension/compression stages 1
- Tweezers 1
- Vacuum equipment 3
- Workshops for Microscopists 4
- Vendors - Light Microscopy 279
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- Autofocusing Devices 9
- Binocular Microscopes 3
- Calibration Devices 9
- Calibration Standards 7
- Cameras for Light Microscopy 13
- Condensers 3
- Confocal Laser Scanning Microscopes 3
- Confocal Microscopes 12
- Detectors 3
- Digital Microscopes 7
- Energy Transfer 4
- Environmental Chambers 10
- Expanded Pupil 1
- Eyepieces 5
- Filters and Beamsplitters 12
- Fluorescence Imaging and Spectroscopy 13
- Fluorescence Microscopes 10
- General Optics 9
- Graticules 7
- High Resolution Imaging 5
- Illuminators 26
- Image Analysis 14
- Infrared Microscopes 1
- LEDS 22
- Lamps 16
- Lasers 10
- Multiphoton Microscopes 2
- Near-Field Scanning Optical Microscopes 1
- Polarized Light Microscopes 6
- Raman Microscopes 1
- Reflected Light Microscopes 7
- Scanning Laser Microscopes 1
- Stereomicroscopes 6
- Total Internal Reflection Fluorescence / TIRF 7
- Transmitted Light Microscopes 8
- Vendors - SEM / TEM / X-Ray Microscopy 73
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- Analytical Transmission Electron Microscopes 3
- Cryo Transmission Electron Microscopes 3
- Dual and Triple Beam Scanning Electron Microscopes 6
- Energy Filtering Transmission Electron Microscopes 2
- Environmental & Variable Pressure Scanning Electron Microscopes 5
- SEM / TEM / X-Ray Microscopy 3
- Scanning / Transmission Electron Microscopes 1
- Scanning Electron Microscopes 9
- Scanning Transmission Electron Microscopes 1
- Specimen Holders for TEMs 8
- Stages for Scanning Electron Microscopes 12
- Stages for Transmission Electron Microscopes 4
- Tabletop Scanning Electron Microscopes 2
- Transmission Electron Microscopes 4
- X-Ray Microscopes 4
- X-Ray Microtomography 6
- Vendors - Scanning Probe Microscopy 113
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- Atomic Force Microscopes 10
- Calibration Devices 10
- Calibration Standards 11
- Cantilevers 12
- Controllers 6
- Dual Mode SPMS 1
- Image Analysis for SPM 5
- Near-Field Scanning Optical Microscopes 6
- SPM Nanolithography 3
- Scanners 12
- Scanning Probe Microscopes 4
- Scanning Probe Microscopy 3
- Scanning Tunnelling Microscopes 3
- Specialized SPM 5
- Stages for SPM 6
- Tips 14
- Vendors - Specimen Preparation / Sample Preparation 183
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- Coating Supplies 5
- Coating Units 12
- Critical Point Dryers 6
- Cryofixation & Cryosubstitution 4
- Cryoultramicrotomes 3
- Cutting, Thinning, Grinding and Polishing Equipment 8
- Cytochemical, Immunochemical & In-Situ Probes 1
- Diamond Knives 6
- Embedding Materials 4
- Fixatives, Stain & Chemicals 8
- Freeze Drying Equipment 4
- Freeze Etch and Fracture Units 3
- Glass, Steel, Diamond Knives 7
- Gold Probes 5
- Grids and Supports 9
- Histology Equipment 8
- Ion Beam Etching & Thinning 4
- Ion Beam Milling 10
- Ion Beam Sputter Coating 2
- Knifemakers 9
- Microtomes 5
- Microwave Processing 4
- Plasma Cleaning 13
- Plasma Etching 6
- Reactive Ion Beam Etching 1
- Section Stainers 6
- Slides and Coverslips 7
- Specimen Preparation / Sample Preparation 7
- Tissue Processors 8
- Ultramicrotomes 5
- Vibratomes 2
- Vendors - Supplies & Photographic Equipment 9
CAMECA
in Secondary Ion Microscopes / SIMS, Secondary Ion Microscopes / SIMS, Particle Analysis, Metrology & Profilometry, Mass Spectrometry, Image Analysis Software, Electron Probe Micro Analysis, Dispersive X-ray Spectroscopy / EDX / WDS, Atom Probes, Atom Probes, Atom Probe Tomography
World-leading supplier of Secondary Ion Mass Spectrometry (SIMS), Electron Probe Microanalysis (EPMA), Atom Probe Tomography (APT) analytica