Must Read App Notes
Two scanning probe microscopy (SPM) techniques—scanning spread resistance microscopy (SSRM) and scanning capacitance microscopy (SCM)—have been used extensively for carrier distribution evaluation of semiconductor devices.
March 1, 2017 By Hitachi High-Technologies Corporation
Scanning Microwave Microscopy (SMM) is an electrical characterization technique used to extract material properties at high frequencies with nanometre accuracy.
March 1, 2017 By Keysight Technologies
The AFM is an excellent tool for measuring topography, but its power extends much further, for instance to characterize electrical properties at the nanoscale.
March 1, 2017 By Asylum Research
Recent App Notes
Kelvin probe force microscopy (KPFM), also called surface potential microscopy, has found broad applications, ranging from corrosion studies of alloys & photovoltaic effects on solar cells to 2D materials research on graphene & molecular electronics.
Polymers play an essential role in modern materials science. Due to their widely varying mechanical and chemical properties they are used in almost every field of application and remain a dynamic component of the development of new materials...
The last three decades have seen the rise of the atomic force microscope (AFM) as an indispensable tool for high-resolution structural analysis of specimens ranging from single molecules to complex biological systems.