Featured Vendors more vendors

Upcoming Events

this week this month

Recent App Notes more app notes

AFM nanoelectrical characterization

AFM nanoelectrical characterization

in App Notes - Scanning Probe Microscopy

Kelvin probe force microscopy (KPFM), also called surface potential microscopy, has found broad applications, ranging from corrosion studies of alloys & photovoltaic effects on solar cells to 2D materials research on graphene & molecular electronics.

Calibrated complex impedance of cells at GHz frequencies using scanning microwave microscopy

Calibrated complex impedance of cells at GHz frequencies using scanning microwave microscopy

in App Notes - Scanning Probe Microscopy

Scanning Microwave Microscopy (SMM) is an electrical characterization technique used to extract material properties at high frequencies with nanometre accuracy.

Vacuum SNDM enhances characterization of carrier distribution in semiconductor materials

Vacuum SNDM enhances characterization of carrier distribution in semiconductor materials

in App Notes - Scanning Probe Microscopy

Two scanning probe microscopy (SPM) techniques—scanning spread resistance microscopy (SSRM) and scanning capacitance microscopy (SCM)—have been used extensively for carrier distribution evaluation of semiconductor devices.

Featured Products more products

Coaters General

For more information visit http://www.emsdiasum.com/microscopy/products/clean/cl...

Free in Vacuum Equipment

NanoScope Analysis Software for AFM/SPM

Bruker AFM Probes has the experience of AFM experts built into every probe. Find...

Free in Image Analysis for SPM

AFM Probes for all AFM/SPM makes/models

Bruker AFM Probes has the experience of AFM experts built into every probe. Find...

Free in Tips
Advertisement