NanoMEGAS products combine beam scanning and precession electron diffraction: ASTAR (TEM Phase and orientation mapping), strain mapping at n
in CMOS Cameras, Plasma Cleaners, Specimen Holders for TEMs, Environmental & Variable Pressure Scanning Electron Microscopes, Transmission Electron Microscopes, Scanning Electron Microscopes, Dual and Triple Beam Scanning Electron Microscopes, Electron Microscopes, Image Analysis Software, Transmission Electron Microscopes, Cryo Transmission Electron Microscopes, Plasma Cleaners, Dual and Triple Beam Scanning Electron Microscopes, Scanning Electron Microscopes
Our innovative microscopy and application expertise helps customers find meaningful answers to the questions that accelerate breakthrough di
Kelvin probe force microscopy (KPFM), also called surface potential microscopy, has found broad applications, ranging from corrosion studies of alloys & photovoltaic effects on solar cells to 2D materials research on graphene & molecular electronics.
Scanning Microwave Microscopy (SMM) is an electrical characterization technique used to extract material properties at high frequencies with nanometre accuracy.
Two scanning probe microscopy (SPM) techniques—scanning spread resistance microscopy (SSRM) and scanning capacitance microscopy (SCM)—have been used extensively for carrier distribution evaluation of semiconductor devices.