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Ted Pella, Inc offers quality consumables and supplies for all aspects of microscopy. Specialized in sample preparation tools and equipment,
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Raith is a leading precision technology solution provider for nanofabrication, electron beam lithography, FIB nanofabrication, nanoengineeri
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PCO is a leading specialist and Pioneer in Cameras and Optoelectronics with more than 30 years of expert knowledge and experience.
Kelvin probe force microscopy (KPFM), also called surface potential microscopy, has found broad applications, ranging from corrosion studies of alloys & photovoltaic effects on solar cells to 2D materials research on graphene & molecular electronics.
Scanning Microwave Microscopy (SMM) is an electrical characterization technique used to extract material properties at high frequencies with nanometre accuracy.
Two scanning probe microscopy (SPM) techniques—scanning spread resistance microscopy (SSRM) and scanning capacitance microscopy (SCM)—have been used extensively for carrier distribution evaluation of semiconductor devices.