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AFM nanoelectrical characterization

AFM nanoelectrical characterization

in App Notes - Scanning Probe Microscopy

Kelvin probe force microscopy (KPFM), also called surface potential microscopy, has found broad applications, ranging from corrosion studies of alloys & photovoltaic effects on solar cells to 2D materials research on graphene & molecular electronics.

Calibrated complex impedance of cells at GHz frequencies using scanning microwave microscopy

Calibrated complex impedance of cells at GHz frequencies using scanning microwave microscopy

in App Notes - Scanning Probe Microscopy

Scanning Microwave Microscopy (SMM) is an electrical characterization technique used to extract material properties at high frequencies with nanometre accuracy.

Vacuum SNDM enhances characterization of carrier distribution in semiconductor materials

Vacuum SNDM enhances characterization of carrier distribution in semiconductor materials

in App Notes - Scanning Probe Microscopy

Two scanning probe microscopy (SPM) techniques—scanning spread resistance microscopy (SSRM) and scanning capacitance microscopy (SCM)—have been used extensively for carrier distribution evaluation of semiconductor devices.

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