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Raith is a leading precision technology solution provider for nanofabrication, electron beam lithography, FIB nanofabrication, nanoengineeri
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Bruker microCT develops and manufactures SkyScan microtomography and nanotomography systems for non-destructive 3D imaging of objects inter
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Andor is a global leader in pioneering and manufacturing high performance light measuring solutions, including scientific digital cameras an
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Ted Pella, Inc offers quality consumables and supplies for all aspects of microscopy. Specialized in sample preparation tools and equipment,
Kelvin probe force microscopy (KPFM), also called surface potential microscopy, has found broad applications, ranging from corrosion studies of alloys & photovoltaic effects on solar cells to 2D materials research on graphene & molecular electronics.
Scanning Microwave Microscopy (SMM) is an electrical characterization technique used to extract material properties at high frequencies with nanometre accuracy.
Two scanning probe microscopy (SPM) techniques—scanning spread resistance microscopy (SSRM) and scanning capacitance microscopy (SCM)—have been used extensively for carrier distribution evaluation of semiconductor devices.