in X-Ray Microscopes, Vendors - Digital Imaging & Analysis, Accessories for Scanning Probe Microscopy, X-Ray Microtomography, X-Ray Microtomography, Vendors - High Resolution / Electron Microscopy, X-Ray Microtomography, Metrology & Profilometry, Image Analysis Software, X-Ray Microscopes
Bruker microCT develops and manufactures SkyScan microtomography and nanotomography systems for non-destructive 3D imaging of objects inter
NanoMEGAS products combine beam scanning and precession electron diffraction: ASTAR (TEM Phase and orientation mapping), strain mapping at n
in CMOS Cameras, Plasma Cleaners, Specimen Holders for TEMs, Environmental & Variable Pressure Scanning Electron Microscopes, Transmission Electron Microscopes, Scanning Electron Microscopes, Dual and Triple Beam Scanning Electron Microscopes, Electron Microscopes, Image Analysis Software, Transmission Electron Microscopes, Cryo Transmission Electron Microscopes, Plasma Cleaners, Dual and Triple Beam Scanning Electron Microscopes, Scanning Electron Microscopes
Our innovative microscopy and application expertise helps customers find meaningful answers to the questions that accelerate breakthrough di
in Stages for Scanning Electron Microscopes, Scanning Electron Microscopes, Vendors - High Resolution / Electron Microscopy, Plasma Etching, Electron and Microscopy Nanolithography, Electron and Microscopy Nanolithography, Scanning Electron Microscopes
Raith is a leading precision technology solution provider for nanofabrication, electron beam lithography, FIB nanofabrication, nanoengineeri
Kelvin probe force microscopy (KPFM), also called surface potential microscopy, has found broad applications, ranging from corrosion studies of alloys & photovoltaic effects on solar cells to 2D materials research on graphene & molecular electronics.
Scanning Microwave Microscopy (SMM) is an electrical characterization technique used to extract material properties at high frequencies with nanometre accuracy.
Two scanning probe microscopy (SPM) techniques—scanning spread resistance microscopy (SSRM) and scanning capacitance microscopy (SCM)—have been used extensively for carrier distribution evaluation of semiconductor devices.
Clean your SEM Chamber AND your SEM/TEM SamplesFree in Accessories for High Res. Electron Microscopy , Specimen Preparation / Sample Preparation , Accessories for Electron Microscopy , Anticontamination Systems , Plasma Cleaners , Plasma Cleaners , Plasma Cleaning , Anticontamination Systems