Offers a complete line of Diamond Knives for all fields of microscopy in a variety of angles at room as well as cryo temperatures.
in X-Ray Microscopes, Vendors - Digital Imaging & Analysis, Accessories for Scanning Probe Microscopy, X-Ray Microtomography, X-Ray Microtomography, Vendors - High Resolution / Electron Microscopy, X-Ray Microtomography, Metrology & Profilometry, Image Analysis Software, X-Ray Microscopes
Bruker microCT develops and manufactures SkyScan microtomography and nanotomography systems for non-destructive 3D imaging of objects inter
in Stages for Scanning Electron Microscopes, Scanning Electron Microscopes, Vendors - High Resolution / Electron Microscopy, Plasma Etching, Electron and Microscopy Nanolithography, Electron and Microscopy Nanolithography, Scanning Electron Microscopes
Raith is a leading precision technology solution provider for nanofabrication, electron beam lithography, FIB nanofabrication, nanoengineeri
in Phase Contrast, Confocal Microscopes, Scanning Electron Microscopes, Low Energy Electron Microscopes, Light and Electron Microscopes, Dual and Triple Beam Scanning Electron Microscopes, Vendors - High Resolution / Electron Microscopy, Dual and Triple Beam Scanning Electron Microscopes, Scanning Electron Microscopes
The leading provider of scientific instrumentation is well known for its innovation and openness to work with researchers and customizing ap
Kelvin probe force microscopy (KPFM), also called surface potential microscopy, has found broad applications, ranging from corrosion studies of alloys & photovoltaic effects on solar cells to 2D materials research on graphene & molecular electronics.
Scanning Microwave Microscopy (SMM) is an electrical characterization technique used to extract material properties at high frequencies with nanometre accuracy.
Two scanning probe microscopy (SPM) techniques—scanning spread resistance microscopy (SSRM) and scanning capacitance microscopy (SCM)—have been used extensively for carrier distribution evaluation of semiconductor devices.
New AFM with high speed imaging and nanomechanical mapping capabilitiesFree in Atomic Force Microscopes , Controllers , Image Analysis for SPM , Scanners , Scanning Probe Microscopy , Cantilevers , Scanning Tunnelling Microscopes , Tips , Scanning Probe Microscopes